ChemInform Abstract: Defects and Dopants in Silicon Nanowires Produced by Metal‐Assisted Chemical Etching. Issue 22 (12th May 2016)

Record Type:: Journal Article
Title:: ChemInform Abstract: Defects and Dopants in Silicon Nanowires Produced by Metal‐Assisted Chemical Etching. Issue 22 (12th May 2016)
Main Title:: ChemInform Abstract: Defects and Dopants in Silicon Nanowires Produced by Metal‐Assisted Chemical Etching
Authors:: Fanciulli, M.
Belli, M.
Paleari, S.
Lamperti, A.
Sironi, M.
Pizio, A.
Abstract:
Is Part Of:: ChemInform. Volume 47:Issue 22(2016)
Journal:: ChemInform
Issue:: Volume 47:Issue 22(2016)
Issue Display:: Volume 47, Issue 22 (2016)
Year:: 2016
Volume:: 47
Issue:: 22
Issue Sort Value:: 2016-0047-0022-0000
Page Start:: no
Page End:: no
Publication Date:: 2016-05-12
Subjects:: inorganic chemistry, review -- nanotechnology -- silicon, Si -- electric properties, superconductors, semiconductors
Chemistry -- Abstracts -- Periodicals
540.5
Journal URLs:: http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1522-2667 ↗
http://onlinelibrary.wiley.com/ ↗
DOI:: 10.1002/chin.201622224 ↗
Languages:: English
ISSNs:: 0931-7597
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 3158.195000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store
Ingest File:: 2571.xml