Determination of the sequence of intersecting lines using Focused Ion Beam/Scanning Electron Microscope1. Issue 3 (7th April 2016)

• Record Type: Journal Article
• Authors: Kim, Jiye; Kim, MinJung; An, JinWook; Kim, Yunje
• Is Part Of: Journal of forensic sciences. Volume 61:Issue 3(2016)
• Page Start: 803
• Page End: 808
• Publication Date: 2016-04-07
• Subjects: forensic science -- document examination -- scanning electron microscope -- sequence discrimination -- intersections -- line sequence; Medical jurisprudence -- Periodicals; Forensic sciences -- Periodicals; Forensic Medicine -- Periodicals; Gerechtelijke geneeskunde; Gerechtelijke chemie; Gerechtelijke psychiatrie; 363.2505
• DOI: 10.1111/1556-4029.13076
• Languages: English
• ISSNs: 0022-1198

Abstract

Abstract: The aim of this study was to verify that the combination of focused ion beam (FIB) and scanning electron microscope/energy‐dispersive X‐ray (SEM/EDX) could be applied to determine the sequence of line crossings. The samples were transferred into FIB/SEM for FIB milling and an imaging operation. EDX was able to explore the chemical components and the corresponding elemental distribution in the intersection. The technique was successful in determining the sequence of heterogeneous line intersections produced using gel pens and red sealing ink with highest success rate (100% correctness). These observations show that the FIB/SEM was the appropriate instrument for an overall examination of document.