Cite
HARVARD Citation
Lu, L. et al. (2016). Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner. Analyst. 141 (5), pp. 1753-1760. [Online].
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Lu, L. et al. (2016). Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner. Analyst. 141 (5), pp. 1753-1760. [Online].