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HARVARD Citation
Kwon, H. et al. (2016). Instability investigation of In0.7Ga0.3As quantum-well MOSFETs with Al2O3 and Al2O3/HfO2. Solid-state electronics. pp. 16-19. [Online].
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Kwon, H. et al. (2016). Instability investigation of In0.7Ga0.3As quantum-well MOSFETs with Al2O3 and Al2O3/HfO2. Solid-state electronics. pp. 16-19. [Online].