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HARVARD Citation
Yamazaki, S. et al. (2016). A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. Solid-state electronics. pp. 25-33. [Online].
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Yamazaki, S. et al. (2016). A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. Solid-state electronics. pp. 25-33. [Online].