Cite
HARVARD Citation
Lee, C. et al. (2016). Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series. Microelectronics and reliability. pp. 20-24. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Lee, C. et al. (2016). Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series. Microelectronics and reliability. pp. 20-24. [Online].