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HARVARD Citation
Megalini, L. et al. (n.d.). Estimation of roughness‐induced scattering losses in III‐nitride laser diodes with a photoelectrochemically etched current aperture. Physica status solidi. 213 (4), pp. 953-957. [Online].
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Megalini, L. et al. (n.d.). Estimation of roughness‐induced scattering losses in III‐nitride laser diodes with a photoelectrochemically etched current aperture. Physica status solidi. 213 (4), pp. 953-957. [Online].