Cite
HARVARD Citation
Rahimo, M. et al. (2016). The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. Microelectronics and reliability. pp. 51-57. [Online].
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Rahimo, M. et al. (2016). The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. Microelectronics and reliability. pp. 51-57. [Online].