Failure analysis of CuW/CuCrZr contact materials in capacitor bank switch. (April 2016)

• Record Type: Journal Article
• Authors: Zhang, Qiao; Liang, Shuhua; Yang, Xiaohong; Li, Zhibing; Li, Yuchun; Zhang, Youpeng
• Is Part Of: Engineering failure analysis. Volume 62(2016:Apr.)
• Page Start: 156
• Page End: 163
• Publication Date: 2016-04
• Subjects: Arc contact -- Failure analysis -- Arc erosion -- Mechanical wear; System failures (Engineering) -- Periodicals; Fracture mechanics -- Periodicals; Reliability (Engineering) -- Periodicals; Pannes -- Périodiques; Rupture, Mécanique de la -- Périodiques; Fiabilité -- Périodiques; Fracture mechanics; Reliability (Engineering); System failures (Engineering); Periodicals; Electronic journals; 620.112
• DOI: 10.1016/j.engfailanal.2016.01.007
• Languages: English
• ISSNs: 1350-6307

Abstract

Abstract: The type test of CuW/CuCrZr arc contact used for ultra-high voltage system capacitor bank switch was conducted. Through the comparative analysis of morphologies, compositions, properties and microstructures of the contact materials before and after failure, it can be found that the abnormal open of moving arc contact and the arc erosion and mechanical wear of static arc contact are the major reasons affecting the arc contact failure. The failure mechanism and main affecting factors were investigated in detail. The results showed that arc erosion and mechanical wear are the two main factors that affect the service lifetime of arc contacts used for ultra-high voltage transmission lines and cannot be ignored. Therefore, improving the arc erosion resistance and mechanical wear resistance simultaneously is the key to prepare the arc contact materials with longer lifetime. Highlights: The experimental samples are completely consistent with the actual working environments. Besides the arc erosion, the mechanical wear also affecting the contact lifetime. The failure mechanisms of arc contact are arc erosion and mechanical wear.