Analysis of hydrogen in materials with and without high hydrogen mobility. (6th January 2016)

• Record Type: Journal Article
• Authors: Stevie, F. A.
• Other Names: Artyushkova Kateryna guestEditor.
• Is Part Of: Surface and interface analysis. Volume 48:Number 5(2016)
• Page Start: 310
• Page End: 314
• Publication Date: 2016-01-06
• Subjects: hydrogen analysis -- depth profiling -- SIMS -- hydrogen forward scattering -- nuclear reaction analysis -- niobium analysis; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5930
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : Hydrogen is a very important element but analysis of hydrogen in solids can be difficult and is not available for many analytical techniques. This paper provides an overview of the capabilities of SIMS and NRA to measure hydrogen concentrations and distributions. Bulk analysis methods provide an overall result, but depth profiles are often needed. SIMS can produce useful and quantifiable depth profiles for hydrogen and the isotopes deuterium and tritium. Hydrogen analysis at the surface and imaging with good lateral resolution can also be achieved with SIMS. However, hydrogen can have high mobility in a variety of materials and this will affect SIMS analysis. For those cases, other surface analysis methods such as hydrogen forward scattering and nuclear reaction analysis are preferred. Hydrogen analysis examples in silicon and in niobium are used for materials without and with high hydrogen mobility respectively. Copyright © 2016 John Wiley & Sons, Ltd.