A technique for calculation of shell thicknesses for core–shell–shell nanoparticles from XPS data. (9th February 2016)

• Record Type: Journal Article
• Authors: Cant, David J. H.; Wang, Yung‐Chen; Castner, David G.; Shard, Alexander G.
• Other Names: Artyushkova Kateryna guestEditor.
• Is Part Of: Surface and interface analysis. Volume 48:Number 5(2016)
• Page Start: 274
• Page End: 282
• Publication Date: 2016-02-09
• Subjects: XPS -- nanoparticles -- core–shell–shell -- measurement -- quantification; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5923
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : This paper extends a straightforward technique for the calculation of shell thicknesses in core–shell nanoparticles to the case of core–shell–shell nanoparticles using X‐ray photoelectron spectroscopy (XPS) data. This method can be applied by XPS analysts and does not require any numerical simulation or advanced knowledge, although iteration is required in the case where both shell thicknesses are unknown. The standard deviation in the calculated thicknesses versus simulated values is typically less than 10%, which is the uncertainty of the electron attenuation lengths used in XPS analysis.© 2016 Crown copyright. Surface and Interface Analysis © 2016 John Wiley & Sons, Ltd.