A simple method for well-defined and clean all-SiC nano-ripples in ambient air. (July 2016)
- Record Type:
- Journal Article
- Title:
- A simple method for well-defined and clean all-SiC nano-ripples in ambient air. (July 2016)
- Main Title:
- A simple method for well-defined and clean all-SiC nano-ripples in ambient air
- Authors:
- Ma, Yuncan
Khuat, Vanthanh
Pan, An - Abstract:
- Abstract: Well-defined and clean all-SiC nano-ripples with a period of about 150 nm are produced via the combination of 800-nm femtosecond laser irradiation and chemical selective etching with mixture solution of 65 wt% HNO3 acid (20 mL) and 40 wt% HF acid (20 mL). The incorporation mechanism of oxygen (O) species into the laser induced obscured nano-ripples is attributed to femtosecond laser induced trapping effect of dangling bonds, while that of chemical etching induced well-defined and clean nano-ripples is assigned to chemical reactions between mixture acid solution and amorphous silicon carbide (SiC) or silicon oxide (SiO2 ). Results from EDX analysis show that the incorporated foreign O species (atomic percentages of 9.39%) was eliminated effectively via chemical etching, while the atomic percentages of silicon (Si) and carbon (C) were about 47.82% and 52.18% respectively, which were similar to those of original SiC material. And the influences of laser irradiation parameters on the nano-ripples are also discussed. Graphical abstract: Highlights: A simple and practical method, using the combination of 800-nm femtosecond laser irradiation and chemical selective etching, for the fabrication of well-defined and clean all-SiC nano-ripples, has been proposed. Incorporation mechanism of oxygen species into the obscured nano-ripples was attributed to the femtosecond laser induced trapping effect of dangling bonds. Formation mechanism of the well-defined and cleanAbstract: Well-defined and clean all-SiC nano-ripples with a period of about 150 nm are produced via the combination of 800-nm femtosecond laser irradiation and chemical selective etching with mixture solution of 65 wt% HNO3 acid (20 mL) and 40 wt% HF acid (20 mL). The incorporation mechanism of oxygen (O) species into the laser induced obscured nano-ripples is attributed to femtosecond laser induced trapping effect of dangling bonds, while that of chemical etching induced well-defined and clean nano-ripples is assigned to chemical reactions between mixture acid solution and amorphous silicon carbide (SiC) or silicon oxide (SiO2 ). Results from EDX analysis show that the incorporated foreign O species (atomic percentages of 9.39%) was eliminated effectively via chemical etching, while the atomic percentages of silicon (Si) and carbon (C) were about 47.82% and 52.18% respectively, which were similar to those of original SiC material. And the influences of laser irradiation parameters on the nano-ripples are also discussed. Graphical abstract: Highlights: A simple and practical method, using the combination of 800-nm femtosecond laser irradiation and chemical selective etching, for the fabrication of well-defined and clean all-SiC nano-ripples, has been proposed. Incorporation mechanism of oxygen species into the obscured nano-ripples was attributed to the femtosecond laser induced trapping effect of dangling bonds. Formation mechanism of the well-defined and clean nano-ripples was assigned to the chemical reactions between mixture acid solution and amorphous silicon carbide or silicon oxide. The influences of laser irradiation parameters on the nano-ripples were systematically discussed. … (more)
- Is Part Of:
- Optics and lasers in engineering. Volume 82(2016)
- Journal:
- Optics and lasers in engineering
- Issue:
- Volume 82(2016)
- Issue Display:
- Volume 82, Issue 2016 (2016)
- Year:
- 2016
- Volume:
- 82
- Issue:
- 2016
- Issue Sort Value:
- 2016-0082-2016-0000
- Page Start:
- 141
- Page End:
- 147
- Publication Date:
- 2016-07
- Subjects:
- Nano-ripples -- Femtosecond laser -- Chemical selective etching -- Silicon carbide
Lasers in engineering -- Periodicals
Optical measurements -- Periodicals
Optics -- Periodicals
Lasers en ingénierie -- Périodiques
Mesures optiques -- Périodiques
Optique -- Périodiques
621.36605 - Journal URLs:
- http://www.sciencedirect.com/science/journal/01438166 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.optlaseng.2016.02.026 ↗
- Languages:
- English
- ISSNs:
- 0143-8166
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 6273.443000
British Library DSC - BLDSS-3PM
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