Stereo-Electronic Effects in Tunneling Junctions: Revisiting the Platform. (2016)

• Record Type: Journal Article
• Authors: Chen, Jiahao; Tevis, Ian; Gathiaka, Symon; Thuo, Martin
• Is Part Of: Procedia engineering. Volume 141(2016)
• Page Start: 138
• Page End: 143
• Publication Date: 2016
• Subjects: odd-even effect -- Self-assembled monolayers -- molecular electronics -- charge transport -- SAMs; Engineering -- Congresses; Engineering -- Periodicals; Engineering; Conference proceedings; Periodicals; 620.005
• DOI: 10.1016/j.proeng.2015.09.228
• Languages: English
• ISSNs: 1877-7058

Abstract

Abstract: Stereo-electronic effects in through-bond tunneling in large area molecular junctions have not been widely studied, largely due to a lack of a clear understanding of basic interfacial properties of self-assembled monolayers (SAMs) — the platform on which these junctions are built. Due to a large volume of work in SAMs, it has been largely assumed that their characteristics are well understood, among these, the so-called odd-even effect. This report demonstrates that there is still a lot to be done, or revisited, with regards to SAM formation, characterization, and, potential, if molecular junctions are to emerge as a useful technology. To illustrate this point, the Whitesides-Porter odd-even quandary of the early 90s (in SAM hydrophobicity) is revisited with a new set of data. An overview of recent efforts in our group to improve quality of tunneling junctions is also presented from three key perspective, viz ; i) Surface: optimizing the surface roughness (Au, RMS roughness <2 Å). ii) Interface: studies on the properties of the unbound SAM interface. iii) Molecule: Engineering the stereo-electronic properties to reveal the role of conformational effects on tunneling currents.