Transistors: Impact of Interfacial Microstructure on Charge Carrier Transport in Solution‐Processed Conjugated Polymer Field‐Effect Transistors (Adv. Mater. 11/2016). Issue 11 (March 2016)

• Record Type: Journal Article
• Authors: Li, Mengmeng; An, Cunbin; Marszalek, Tomasz; Baumgarten, Martin; Müllen, Klaus; Pisula, Wojciech
• Is Part Of: Advanced materials. Volume 28:Issue 11(2016)
• Page Start: 2244
• Page End: 2244
• Publication Date: 2016-03
• Subjects: interfaces -- microstructures -- organic field‐effect transistors -- transistors -- solution processing; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201670074
• Languages: English
• ISSNs: 0935-9648

Abstract

Abstract : The interfacial microstructure of a semicrystalline semiconductor polymer film is precisely modulated by the dielectric with surface roughness ranging from 0.15 to 0.39 nm, without affecting the morphology in the upper layers, as described by K. Müllen, W. Pisula, and co‐workers. On page 2245, they demonstrate that the interfacial microstructure has only a minor impact on transistor performance because charge carriers can bypass the interfacial defects.