Impact of Interfacial Microstructure on Charge Carrier Transport in Solution‐Processed Conjugated Polymer Field‐Effect Transistors. Issue 11 (14th January 2016)

• Record Type: Journal Article
• Authors: Li, Mengmeng; An, Cunbin; Marszalek, Tomasz; Baumgarten, Martin; Müllen, Klaus; Pisula, Wojciech
• Is Part Of: Advanced materials. Volume 28:Issue 11(2016)
• Page Start: 2245
• Page End: 2252
• Publication Date: 2016-01-14
• Subjects: interfaces -- microstructures -- organic field‐effect transistors -- transistors -- solution processing; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201503552
• Languages: English
• ISSNs: 0935-9648

Abstract

Abstract : The surface roughness of a dielectric is precisely tuned, allowing a fine control solely over the interfacial microstructure in a semicrystalline semiconductor polymer film without affecting the morphology in the upper layers. The interfacial microstructure is found to have only a minor impact on the transport originating from bypassing of interfacial defects by the charge carriers.