In Operando X‐Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device. Issue 9 (21st December 2015)

• Record Type: Journal Article
• Authors: Wallentin, Jesper; Osterhoff, Markus; Salditt, Tim
• Is Part Of: Advanced materials. Volume 28:Issue 9(2016)
• Page Start: 1788
• Page End: 1792
• Publication Date: 2015-12-21
• Subjects: lattice contraction -- single nanowire devices -- X‐ray nanodiffraction; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201504188
• Languages: English
• ISSNs: 0935-9648

Abstract

Abstract : Hard X‐ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub‐nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.