Ultra-low dielectric closed porous materials via incorporating surface-functionalized hollow silica microspheres: preparation, interface property and low dielectric performance. Issue 3 (4th January 2016)
- Record Type:
- Journal Article
- Title:
- Ultra-low dielectric closed porous materials via incorporating surface-functionalized hollow silica microspheres: preparation, interface property and low dielectric performance. Issue 3 (4th January 2016)
- Main Title:
- Ultra-low dielectric closed porous materials via incorporating surface-functionalized hollow silica microspheres: preparation, interface property and low dielectric performance
- Authors:
- Wei, Xiaonan
Zhao, Cuijiao
Ma, Jiajun
Huang, Yawen
Cao, Ke
Chang, Guanjun
Yang, Junxiao - Abstract:
- Abstract : One effective route to reduce the dielectric constant is to directly incorporate hollow silica (HoSiO2 ) microspheres into a polymeric matrix. Abstract : One effective route to reduce the dielectric constant is to directly incorporate hollow silica (HoSiO2 ) microspheres into a polymeric matrix. However, the incompatibility between silica and hydrophobic polymers possibly results in interfacial defects and polarization, and thus a high dielectric loss. In this study, the HoSiO2 microspheres were coated by polystyrene using a surface-initiated ATRP method in order to enhance interfacial property. TGA results indicated that the weight percentage of polystyrene in resulting microspheres (HoSiO2 @SI-PS) reached around 33 wt%. OM images showed that the thickness of the polystyrene layer reached around 2 μm. HoSiO2 @SI-PS microspheres with a weight percentage of 25% were incorporated into polyethylene (PE) to prepare the composites. The dielectric measurement results indicated that the dielectric constant of the composites was reduced to 2.05, while maintaining low dielectric loss at the level of 10 −4 . In comparison, when HoSiO2 @C-PS microspheres, which were prepared by conventional vinyl-initiated free radical polymerization, were incorporated into polyethylene, the dielectric loss was greatly elevated to 0.007. SEM images and water absorption experiments further revealed that the low dielectric loss of PE/HoSiO2 @SI-PS was related to the dense interfacialAbstract : One effective route to reduce the dielectric constant is to directly incorporate hollow silica (HoSiO2 ) microspheres into a polymeric matrix. Abstract : One effective route to reduce the dielectric constant is to directly incorporate hollow silica (HoSiO2 ) microspheres into a polymeric matrix. However, the incompatibility between silica and hydrophobic polymers possibly results in interfacial defects and polarization, and thus a high dielectric loss. In this study, the HoSiO2 microspheres were coated by polystyrene using a surface-initiated ATRP method in order to enhance interfacial property. TGA results indicated that the weight percentage of polystyrene in resulting microspheres (HoSiO2 @SI-PS) reached around 33 wt%. OM images showed that the thickness of the polystyrene layer reached around 2 μm. HoSiO2 @SI-PS microspheres with a weight percentage of 25% were incorporated into polyethylene (PE) to prepare the composites. The dielectric measurement results indicated that the dielectric constant of the composites was reduced to 2.05, while maintaining low dielectric loss at the level of 10 −4 . In comparison, when HoSiO2 @C-PS microspheres, which were prepared by conventional vinyl-initiated free radical polymerization, were incorporated into polyethylene, the dielectric loss was greatly elevated to 0.007. SEM images and water absorption experiments further revealed that the low dielectric loss of PE/HoSiO2 @SI-PS was related to the dense interfacial structure, strong interfacial interaction and low water absorption ability. … (more)
- Is Part Of:
- RSC advances. Volume 6:Issue 3(2016)
- Journal:
- RSC advances
- Issue:
- Volume 6:Issue 3(2016)
- Issue Display:
- Volume 6, Issue 3 (2016)
- Year:
- 2016
- Volume:
- 6
- Issue:
- 3
- Issue Sort Value:
- 2016-0006-0003-0000
- Page Start:
- 1870
- Page End:
- 1876
- Publication Date:
- 2016-01-04
- Subjects:
- Chemistry -- Periodicals
540.5 - Journal URLs:
- http://pubs.rsc.org/en/Journals/JournalIssues/RA ↗
http://www.rsc.org/ ↗ - DOI:
- 10.1039/c5ra21886a ↗
- Languages:
- English
- ISSNs:
- 2046-2069
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8036.750300
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 705.xml