Cite
HARVARD Citation
Schwarzenbach, W. et al. (2016). Ultra-thin body & buried oxide SOI substrate development and qualification for Fully Depleted SOI device with back bias capability. Solid-state electronics. pp. 2-9. [Online].
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Schwarzenbach, W. et al. (2016). Ultra-thin body & buried oxide SOI substrate development and qualification for Fully Depleted SOI device with back bias capability. Solid-state electronics. pp. 2-9. [Online].