Cite
HARVARD Citation
Liu, Y. et al. (2016). Quantization noise consideration and characterization in Sigma-Delta MEMS accelerometer. Microelectronics journal. pp. 53-60. [Online].
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Liu, Y. et al. (2016). Quantization noise consideration and characterization in Sigma-Delta MEMS accelerometer. Microelectronics journal. pp. 53-60. [Online].