Cite
HARVARD Citation
Han, B. et al. (2016). Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO2 matrix studied by atom probe tomography. RSC advances. 6 (5), pp. 3617-3622. [Online].
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Han, B. et al. (2016). Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO2 matrix studied by atom probe tomography. RSC advances. 6 (5), pp. 3617-3622. [Online].