Cite
HARVARD Citation
Keiber, T. et al. (2015). Comparison of local distortions in Ba8Ga16X30 (X = Si, Ge, Sn): an EXAFS study. Journal of materials chemistry. 3 (40), pp. 10574-10582. [Online].
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Keiber, T. et al. (2015). Comparison of local distortions in Ba8Ga16X30 (X = Si, Ge, Sn): an EXAFS study. Journal of materials chemistry. 3 (40), pp. 10574-10582. [Online].