Cite
HARVARD Citation
Saleem, M. et al. (2015). Design optimization of RF-MEMS switch considering thermally induced residual stress and process uncertainties. Microelectronics and reliability. 55 (11), pp. 2284-2298. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Saleem, M. et al. (2015). Design optimization of RF-MEMS switch considering thermally induced residual stress and process uncertainties. Microelectronics and reliability. 55 (11), pp. 2284-2298. [Online].