Cite
HARVARD Citation
Helfmeier, C. et al. (2015). Ultra sensitive measurement of dielectric current under pulsed stress conditions. Microelectronics and reliability. 55 (11), pp. 2254-2257. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Helfmeier, C. et al. (2015). Ultra sensitive measurement of dielectric current under pulsed stress conditions. Microelectronics and reliability. 55 (11), pp. 2254-2257. [Online].