High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors. (August 2015) - Yang, Hao; Jones, Lewys; Ryll, Henning; Simson, Martin; Soltau, Heike; Kondo, Yukihito; Sagawa, Ryusuke; Banba, Hiroyuki; Pennycook, Timothy J; Nellist, Peter D.