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Rouvimov, S. et al. (n.d.). TEM Analysis of Defects in AlGaN Heterostructures Grown on C-AI2O3 by Plasma Assisted Molecular Beam Epitaxy. Microscopy and microanalysis. pp. 1803-1804. [Online].
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Rouvimov, S. et al. (n.d.). TEM Analysis of Defects in AlGaN Heterostructures Grown on C-AI2O3 by Plasma Assisted Molecular Beam Epitaxy. Microscopy and microanalysis. pp. 1803-1804. [Online].