Cite
HARVARD Citation
Huang, J. et al. (n.d.). A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation. Microscopy and microanalysis. pp. 1839-1840. [Online].
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Huang, J. et al. (n.d.). A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation. Microscopy and microanalysis. pp. 1839-1840. [Online].