Cite
HARVARD Citation
Presley, M. et al. (n.d.). Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries. Microscopy and microanalysis. pp. 1411-1412. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Presley, M. et al. (n.d.). Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries. Microscopy and microanalysis. pp. 1411-1412. [Online].