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HARVARD Citation
Puglisi, F. et al. (n.d.). A multi‐scale methodology connecting device physics to compact models and circuit applications for OxRAM technology. Physica status solidi. 213 (2), pp. 289-301. [Online].
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Puglisi, F. et al. (n.d.). A multi‐scale methodology connecting device physics to compact models and circuit applications for OxRAM technology. Physica status solidi. 213 (2), pp. 289-301. [Online].