Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys. Issue 9 (20th April 2015)

• Record Type: Journal Article
• Authors: Parish, Chad M.; Field, Kevin G.; Certain, Alicia G.; Wharry, Janelle P.
• Is Part Of: Journal of materials research. Volume 30:Issue 9(2015)
• Page Start: 1275
• Page End: 1289
• Publication Date: 2015-04-20
• Subjects: Materials -- Research -- Periodicals; 620.1105
• DOI: 10.1557/jmr.2015.32
• Languages: English
• ISSNs: 0884-2914

Abstract

Abstract: Abstract : This paper provides an overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. Finally, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.