Corrigendum to "Modelling of through silicon via and devices electromagnetic coupling" [Microelectron. J. 42 (2011) 316–324]. Issue 11 (November 2015)

Record Type:
Journal Article
Title:
Corrigendum to "Modelling of through silicon via and devices electromagnetic coupling" [Microelectron. J. 42 (2011) 316–324]. Issue 11 (November 2015)
Main Title:
Corrigendum to "Modelling of through silicon via and devices electromagnetic coupling" [Microelectron. J. 42 (2011) 316–324]
Authors:
Abouelatta-Ebrahim, Mohamed
Dahmani, Rabah
Valorge, Olivier
Calmon, Francis
Gontrand, Christian
Abstract:
Is Part Of:
Microelectronics journal. Volume 46:Issue 11(2015)
Journal:
Microelectronics journal
Issue:
Volume 46:Issue 11(2015)
Issue Display:
Volume 46, Issue 11 (2015)
Year:
2015
Volume:
46
Issue:
11
Issue Sort Value:
2015-0046-0011-0000
Page Start:
1103
Page End:
Publication Date:
2015-11
Subjects:
Microelectronics -- Periodicals
Microélectronique -- Périodiques
Microelectronics
Electronic journals
Journals - contents and abstracts
Periodicals
621.3805
Journal URLs:
http://catalog.hathitrust.org/api/volumes/oclc/5877621.html ↗
http://www.sciencedirect.com/science/journal/00262692 ↗
http://www.intute.ac.uk/sciences/cgi-bin/fullrecord.pl?handle=lesa.1012319367 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗
DOI:
10.1016/j.mejo.2015.09.012 ↗
Languages:
English
ISSNs:
0959-8324
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library DSC - 5758.973000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:
2361.xml