Incorporation of hafnium (IV) into KTP framework from phosphate‐fluoride fluxes. Issue 2 (17th December 2015)

• Record Type: Journal Article
• Authors: Zatovsky, Igor V.; Slobodyanik, Nikolay S.; Ivanenko, V. I.; Oseledchik, Yu. S.; Letsenko, V. Yu.; Ushchapivska, Tetiana I.
• Is Part Of: Crystal research and technology. Volume 51:Issue 2(2016)
• Page Start: 178
• Page End: 182
• Publication Date: 2015-12-17
• Subjects: KTP -- crystal growth -- XRD -- X‐Ray fluorescence analysis -- SHG -- transmission spectra; Crystallography -- Periodicals; 548
• DOI: 10.1002/crat.201500268
• Languages: English
• ISSNs: 0232-1300

Abstract

Abstract : Hf‐doped KTP crystals with various hafnium contents (KTi1‐X HfX OPO4, х = 0.008‐0.107) have been grown in K2 O‐P2 O5 ‐TiO2 ‐HfF4 system using high temperature flux technique. KTP:Hf exhibited higher SHG efficiency compared to pure KTP, which makes it possible to generate new material on the basis of KTP:Hf crystals. The presence of Hf(IV) in KTP results in absorption of light, especially in the violet region and produces absorption peaks at about 387 nm. Abstract : Solid solutions KTi1‐X HfX OPO4 (х = 0.008 – 0.107) possessing the KTiOPO4 structure, have been synthesized in molten system K2 O‐P2 O5 ‐TiO2 ‐HfF4 . The crystal growth experiment of Hf‐doped KTP crystal has been reported. The X‐ray powder diffraction data and chemical analysis are also presented. It has been shown that KTiOPO4 crystal structure slightly changes when Hf incorporates into the framework. Transmission/absorption spectra of KTi0.974 Hf0.026 OPO4 crystals have been recorded. The incorporation of Hf ions shifts the optical absorption edge in the UV‐visible spectrum towards the long‐wavelength region with absorption near 387 nm.