Improvement in X‐ray stress measurement using Debye–Scherrer rings by in‐plane averaging. (1st February 2016)

• Record Type: Journal Article
• Authors: Miyazaki, Toshiyuki; Fujimoto, Yohei; Sasaki, Toshihiko
• Is Part Of: Journal of applied crystallography. Volume 49:Part 1(2016:Feb.)
• Page Start: 241
• Page End: 249
• Publication Date: 2016-02-01
• Subjects: X‐ray stress measurement -- Debye–Scherrer rings -- in‐plane averaging; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S160057671600128X
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : An improvement in X‐ray stress measurement using Debye–Scherrer rings is proposed. Even if the specimen is coarse grained, in‐plane averaging can improve the accuracy of the measurement. Abstract : A technique to improve X‐ray stress measurement using Debye–Scherrer rings is reported. In previous work, a Fourier‐series‐based generalization of the cosα method was proposed, which can measure the stress from a Debye–Scherrer ring. That technique and the cosα method have difficulties in determining the stress when the grain size of the specimen is relatively large and the Debye–Scherrer ring is grainy. To cope with this problem, in‐plane averaging has been used to improve the cosα method when measuring coarse‐grained specimens. In this study, Fourier series analysis is incorporated with in‐plane averaging and it is explained how in‐plane averaging improves the stress measurement. Furthermore, the validity of the new technique is demonstrated by measuring the stress of a carbon steel specimen.