Cite
HARVARD Citation
Feng, Y. et al. (n.d.). Enhanced interference using microcavity structure for accurate thin film thickness measurement. Physica status solidi. 212 (12), pp. 2718-2721. [Online].
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Feng, Y. et al. (n.d.). Enhanced interference using microcavity structure for accurate thin film thickness measurement. Physica status solidi. 212 (12), pp. 2718-2721. [Online].