Nanoimaging of Open‐Circuit Voltage in Photovoltaic Devices. Issue 23 (24th September 2015)

• Record Type: Journal Article
• Authors: Tennyson, Elizabeth M.; Garrett, Joseph L.; Frantz, Jesse A.; Myers, Jason D.; Bekele, Robel Y.; Sanghera, Jasbinder S.; Munday, Jeremy N.; Leite, Marina S.
• Is Part Of: Advanced energy materials. Volume 5:Issue 23(2015:Dec.)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2015-09-24
• Subjects: Kelvin probe force microscopy -- nanoimaging -- open‐circuit voltage -- photovoltaics -- solar cells; Energy harvesting -- Materials -- Periodicals; Energy conversion -- Materials -- Periodicals; Energy storage -- Materials -- Periodicals; Photovoltaics -- Periodicals; Fuel cells -- Periodicals; Thermoelectric materials -- Periodicals; 621.31
• DOI: 10.1002/aenm.201501142
• Languages: English
• ISSNs: 1614-6832

Abstract

Abstract : A novel imaging platform to determine the open‐circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments.