Exploring Two‐Dimensional Transport Phenomena in Metal Oxide Heterointerfaces for Next‐Generation, High‐Performance, Thin‐Film Transistor Technologies. Issue 41 (9th September 2015)

• Record Type: Journal Article
• Authors: Labram, John G.; Lin, Yen‐Hung; Anthopoulos, Thomas D.
• Is Part Of: Small. Volume 11:Issue 41(2015)
• Page Start: 5472
• Page End: 5482
• Publication Date: 2015-09-09
• Subjects: energy quantization -- metal oxides -- semiconductors -- transistors -- heterostructures -- two‐dimensional transport -- solution processing; Nanotechnology -- Periodicals; Nanoparticles -- Periodicals; Microtechnology -- Periodicals; 620.5
• DOI: 10.1002/smll.201501350
• Languages: English
• ISSNs: 1613-6810

Abstract

Abstract : In the last decade, metal oxides have emerged as a fascinating class of electronic material, exhibiting a wide range of unique and technologically relevant characteristics. For example, thin‐film transistors formed from amorphous or polycrystalline metal oxide semiconductors offer the promise of low‐cost, large‐area, and flexible electronics, exhibiting performances comparable to or in excess of incumbent silicon‐based technologies. Atomically flat interfaces between otherwise insulating or semiconducting complex oxides, are also found to be highly conducting, displaying 2‐dimensional (2D) charge transport properties, strong correlations, and even superconductivity. Field‐effect devices employing such carefully engineered interfaces are hoped to one day compete with traditional group IV or III–V semiconductors for use in the next‐generation of high‐performance electronics. In this Concept article we provide an overview of the different metal oxide transistor technologies and potential future research directions. In particular, we look at the recent reports of multilayer oxide thin‐film transistors and the possibility of 2D electron transport in these disordered/polycrystalline systems and discuss the potential of the technology for applications in large‐area electronics. Abstract : Exotic charge‐transport phenomena have been reported for several 2D semiconducting systems and their devices. Recent experimental results suggest that similar phenomena can be achieved in metal oxide‐based systems. In this article, an overview of different transistor technologies, the operation of which relies on low‐dimensional charge‐transport, is given and potential future research directions in the area of thin‐film transistors are discussed.