Time‐resolved small‐angle X‐ray scattering study of void fraction evolution in high‐density polyethylene during stress unloading and strain recovery. Issue 11 (5th May 2015) - Addiego, Frédéric
Abstract By combining time‐resolved small‐angle X‐ray scattering and quantitative microscopy, it is shown that void fraction in high‐density polyethylene has permanent and non‐permanent components during tensile testing.