Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size. Issue 19 (7th October 2015)
- Record Type:
- Journal Article
- Title:
- Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size. Issue 19 (7th October 2015)
- Main Title:
- Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
- Authors:
- Seah, M. P.
Spencer, S. J.
Havelund, R.
Gilmore, I. S.
Shard, A. G. - Abstract:
- <abstract abstract-type="toc"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <graphic position="anchor" id="ga" xlink:href="ark:/27927/pgj2qrmhq59" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" />This paper presents, for the first time, the different operating parameters defining the best depth resolution in SIMS organic analysis.</p> </abstract>
- Is Part Of:
- Analyst. Volume 140:Issue 19(2015)
- Journal:
- Analyst
- Issue:
- Volume 140:Issue 19(2015)
- Issue Display:
- Volume 140, Issue 19 (2015)
- Year:
- 2015
- Volume:
- 140
- Issue:
- 19
- Issue Sort Value:
- 2015-0140-0019-0000
- Page Start:
- 6508
- Page End:
- 6516
- Publication Date:
- 2015-10-07
- Subjects:
- Chemistry, Analytic -- Periodicals
543 - Journal URLs:
- http://pubs.rsc.org/en/journals/journalissues/an?e=1#!issueid=an139020&type=current&issnprint=0003-2654 ↗
http://www.rsc.org/ ↗ - DOI:
- 10.1039/c5an01473e ↗
- Languages:
- English
- ISSNs:
- 0003-2654
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0893.000000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 3675.xml