Development of an Automated LIBS Analytical Test System Integrated with Component Control and Spectrum Analysis Capabilities *supported by the National Major Scientific Instruments and Equipment Development Special Funds of China (No. 2011YQ030113). (August 2015)

• Record Type: Journal Article
• Authors: Ding, Yu; Tian, Di; Chen, Feipeng; Chen, Pengfei; Qiao, Shujun; Yang, Guang; Li, Chunsheng
• Is Part Of: Plasma science and technology. Volume 17:Number 8(2015:Aug.)
• Page Start: 704
• Page End: 710
• Publication Date: 2015-08
• Subjects: Plasma (Ionized gases) -- Periodicals; 530.44
• DOI: 10.1088/1009-0630/17/8/16
• Languages: English
• ISSNs: 1009-0630

Abstract

<abstract> <title>Abstract</title> <p>The present paper proposes an automated Laser-Induced Breakdown Spectroscopy (LIBS) analytical test system, which consists of a LIBS measurement and control platform based on a modular design concept, and a LIBS qualitative spectrum analysis software and is developed in C#. The platform provides flexible interfacing and automated control; it is compatible with different manufacturer component models and is constructed in modularized form for easy expandability. During peak identification, a more robust peak identification method with improved stability in peak identification has been achieved by applying additional smoothing on the slope obtained by calculation before peak identification. For the purpose of element identification, an improved main lines analysis method, which detects all elements on the spectral peak to avoid omission of certain elements without strong spectral lines, is applied to element identification in the tested LIBS samples. This method also increases the identification speed. In this paper, actual applications have been carried out. According to tests, the analytical test system is compatible with components of various models made by different manufacturers. It can automatically control components to get experimental data and conduct filtering, peak identification and qualitative analysis, etc. on spectral data.</p> </abstract>