Wide-range CTAT and PTAT sensors with second-order calibration for on-chip thermal monitoring. Issue 9 (September 2015)
- Record Type:
- Journal Article
- Title:
- Wide-range CTAT and PTAT sensors with second-order calibration for on-chip thermal monitoring. Issue 9 (September 2015)
- Main Title:
- Wide-range CTAT and PTAT sensors with second-order calibration for on-chip thermal monitoring
- Authors:
- Wang, Chua-Chin
Lu, Wen-Je
Wu, Tzu-Chao - Abstract:
- <abstract abstract-type="author" id="ab0005"> <title id="sect0005">Abstract</title> <sec> <p id="sp0065">This paper presents wide-range complementary to absolute temperature (CTAT) and proportional to absolute temperature (PTAT) sensors with second-order calibration for on-chip thermal monitoring. Particularly, a current mirror and an n-well resistor are used in these sensors to eliminate the second-order term of the temperature coefficient to linearize the transfer function between the output voltage and the temperature. The proposed CTAT and PTAT sensors are implemented on silicon using a typical 0.18 μm CMOS process. The core area of the CTAT and PTAT sensors is 0.0125 mm<sup>2</sup> and 0.0074 mm<sup>2</sup>, respectively. In the range from <inline-formula><alternatives><inline-graphic xlink:href="ark:/27927/pgj2frffp9r" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="si0023.gif" overflow="scroll" id="d13e708" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo>−</mml:mo><mml:mn>55</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:math></alternatives></inline-formula> to <inline-formula><alternatives><inline-graphic xlink:href="ark:/27927/pgj2frfgbvw" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="si0024.gif" overflow="scroll" id="d13e719" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mn>155</mml:mn><mml:mspace width="0.25em"<abstract abstract-type="author" id="ab0005"> <title id="sect0005">Abstract</title> <sec> <p id="sp0065">This paper presents wide-range complementary to absolute temperature (CTAT) and proportional to absolute temperature (PTAT) sensors with second-order calibration for on-chip thermal monitoring. Particularly, a current mirror and an n-well resistor are used in these sensors to eliminate the second-order term of the temperature coefficient to linearize the transfer function between the output voltage and the temperature. The proposed CTAT and PTAT sensors are implemented on silicon using a typical 0.18 μm CMOS process. The core area of the CTAT and PTAT sensors is 0.0125 mm<sup>2</sup> and 0.0074 mm<sup>2</sup>, respectively. In the range from <inline-formula><alternatives><inline-graphic xlink:href="ark:/27927/pgj2frffp9r" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="si0023.gif" overflow="scroll" id="d13e708" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo>−</mml:mo><mml:mn>55</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:math></alternatives></inline-formula> to <inline-formula><alternatives><inline-graphic xlink:href="ark:/27927/pgj2frfgbvw" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="si0024.gif" overflow="scroll" id="d13e719" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mn>155</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:math></alternatives></inline-formula>, the worst deviation of the CTAT and PTAT temperature sensors is measured to be <inline-formula><alternatives><inline-graphic xlink:href="ark:/27927/pgj2frfftnb" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="si0025.gif" overflow="scroll" id="d13e728" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo>−</mml:mo><mml:mn>3.75</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi><mml:mspace width="0.33em" /><mml:mi>to</mml:mi><mml:mo>+</mml:mo><mml:mn>3.34</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:math></alternatives></inline-formula> and <inline-formula><alternatives><inline-graphic xlink:href="ark:/27927/pgj2frfg8c4" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="si0026.gif" overflow="scroll" id="d13e752" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo>−</mml:mo><mml:mn>3.73</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi><mml:mspace width="0.33em" /><mml:mi>to</mml:mi><mml:mo>+</mml:mo><mml:mn>3.85</mml:mn><mml:mspace width="0.25em" /><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:math></alternatives></inline-formula>, respectively. The maximum non-linearity reduction of the CTAT and PTAT sensors is 59.84% and 87.48%, respectively, by the proposed second-order calibration. Notably, the overhead area of the CTAT and PTAT sensors is only 0.64% and 1.08%, respectively.</p> </sec> </abstract> … (more)
- Is Part Of:
- Microelectronics journal. Volume 46:Issue 9(2015)
- Journal:
- Microelectronics journal
- Issue:
- Volume 46:Issue 9(2015)
- Issue Display:
- Volume 46, Issue 9 (2015)
- Year:
- 2015
- Volume:
- 46
- Issue:
- 9
- Issue Sort Value:
- 2015-0046-0009-0000
- Page Start:
- 819
- Page End:
- 824
- Publication Date:
- 2015-09
- Subjects:
- Microelectronics -- Periodicals
Microélectronique -- Périodiques
Microelectronics
Electronic journals
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621.3805 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/5877621.html ↗
http://www.sciencedirect.com/science/journal/00262692 ↗
http://www.intute.ac.uk/sciences/cgi-bin/fullrecord.pl?handle=lesa.1012319367 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.mejo.2015.06.004 ↗
- Languages:
- English
- ISSNs:
- 0959-8324
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- Legaldeposit
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