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HARVARD Citation
Lin, P. et al. (n.d.). Effects of temperature and voids on the interfacial fracture of Si/a‐Si3N4 bilayer systems. Physica status solidi. 252 (9), pp. 2013-2019. [Online].
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Lin, P. et al. (n.d.). Effects of temperature and voids on the interfacial fracture of Si/a‐Si3N4 bilayer systems. Physica status solidi. 252 (9), pp. 2013-2019. [Online].