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    Mu, L. et al. (n.d.). Design and test of a capacitance detection circuit based on a transimpedance amplifier*Project supported by the National Natural Science Foundation of China (No. 61127008) and the Subsidized Program of the National High Technology Research and Development Program of China (No. 2011AA040404).. Journal of semiconductors. pp. 225-. [Online]. 
  
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