Cite
HARVARD Citation
Eng, D. et al. (n.d.). Dielectric characterization of thin films using microstrip ring resonators. Microwave and optical technology letters. 57 (10), pp. 2306-2310. [Online].
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Eng, D. et al. (n.d.). Dielectric characterization of thin films using microstrip ring resonators. Microwave and optical technology letters. 57 (10), pp. 2306-2310. [Online].