Confirmation of the Dominant Defect Mechanism in Amorphous In–Zn–O Through the Application of In Situ Brouwer Analysis. Issue 7 (8th April 2015)

• Record Type: Journal Article
• Authors: Moffitt, Stephanie L.; Adler, Alexander U.; Gennett, Thomas; Ginley, David S.; Perkins, John D.; Mason, Thomas O.; Zhou, X.‐D.
• Is Part Of: Journal of the American Ceramic Society. Volume 98:Issue 7(2015)
• Page Start: 2099
• Page End: 2103
• Publication Date: 2015-04-08
• Subjects: Ceramics -- Periodicals; 620.1405
• DOI: 10.1111/jace.13518
• Languages: English
• ISSNs: 0002-7820

Abstract

<abstract abstract-type="main" id="jace13518-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The dominant point defect mechanism of amorphous (a‐) indium zinc oxide (IZO) was probed through <italic>in situ</italic> electrical characterization of sputtered a‐IZO thin films in response to changes in oxygen partial pressure (pO<inline-formula><alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgj1n9xfv29" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:00027820:media:jace13518:jace13518-math-0001" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mrow /><mml:mn mathvariant="bold">2</mml:mn></mml:msub></mml:math></alternatives></inline-formula>) at 300<inline-formula><alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgj1n9xfv6h" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:00027820:media:jace13518:jace13518-math-0002" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msup><mml:mrow /><mml:mo>∘</mml:mo></mml:msup></mml:math></alternatives></inline-formula>C. The results yielded a power law dependence of conductivity (σ) versus pO<inline-formula><alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgj1n9xfv5z" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:00027820:media:jace13518:jace13518-math-0003" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mrow /><mml:mn mathvariant="bold">2</mml:mn></mml:msub></mml:math></alternatives></inline-formula> of ∼−1/6. This experimental method, known as Brouwer analysis, confirms doubly‐charged oxygen vacancies as the dominant defect species in a‐IZO. The success of this study suggests that Brouwer analysis is a viable method for studying the defect mechanisms of amorphous oxides.</p> </abstract>