High‐accuracy X‐ray absorption spectra from mM solutions of nickel (II) complexes with multiple solutions using transmission XAS. (18th June 2015)
- Record Type:
- Journal Article
- Title:
- High‐accuracy X‐ray absorption spectra from mM solutions of nickel (II) complexes with multiple solutions using transmission XAS. (18th June 2015)
- Main Title:
- High‐accuracy X‐ray absorption spectra from mM solutions of nickel (II) complexes with multiple solutions using transmission XAS
- Authors:
- Chantler, Christopher T.
Islam, M. Tauhidul
Best, Stephen P.
Tantau, Lachlan J.
Tran, Chanh Q.
Cheah, Mun Hon
Payne, Andrew T. - Abstract:
- <abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A new approach is introduced for determining X‐ray absorption spectroscopy (XAS) spectra on absolute and relative scales using multiple solutions with different concentrations by the characterization and correction of experimental systematics. This hybrid technique is a development of standard X‐ray absorption fine structure (XAFS) along the lines of the high‐accuracy X‐ray extended range technique (XERT) but with applicability to solutions, dilute systems and cold cell environments. This methodology has been applied to determining absolute XAS of bis(<italic>N</italic>‐n‐propyl‐salicylaldiminato) nickel(II) and bis(<italic>N</italic>‐i‐propyl‐salicylaldiminato) nickel(II) complexes with square planar and tetrahedral structures in 15 m<italic>M</italic> and 1.5 m<italic>M</italic> dilute solutions. It is demonstrated that transmission XAS from dilute systems can provide excellent X‐ray absorption near‐edge structure (XANES) and XAFS spectra, and that transmission measurements can provide accurate measurement of subtle differences including coordination geometries. For the first time, (transmission) XAS of the isomers have been determined from low‐concentration solutions on an absolute scale with a 1–5% accuracy, and with relative precision of 0.1% to 0.2% in the active XANES and XAFS regions after inclusion of systematic corrections.</p> </abstract>
- Is Part Of:
- Journal of synchrotron radiation. Volume 22:Part 4(2015)
- Journal:
- Journal of synchrotron radiation
- Issue:
- Volume 22:Part 4(2015)
- Issue Display:
- Volume 22, Issue 4, Part 4 (2015)
- Year:
- 2015
- Volume:
- 22
- Issue:
- 4
- Part:
- 4
- Issue Sort Value:
- 2015-0022-0004-0004
- Page Start:
- 1008
- Page End:
- 1021
- Publication Date:
- 2015-06-18
- Subjects:
- Synchrotron radiation -- Periodicals
Free electron lasers -- Periodicals
539.73505 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1107/S16005775 ↗
http://journals.iucr.org/s/journalhomepage.html ↗
http://www.blackwell-synergy.com/openurl?genre=journal&issn=0909-0495 ↗
http://onlinelibrary.wiley.com/ ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1107/S1600577515006190 ↗
- Languages:
- English
- ISSNs:
- 0909-0495
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5068.035000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 3216.xml