Effects of preferential etching treatment of CZTS absorber layer by deionized water. Issue 6 (7th April 2015)

• Record Type: Journal Article
• Authors: Miyazaki, H.; Aono, M.; Kishimura, H.; Katagiri, H.; Tsuboi, Nozomu; Wakita, Kazuki; Yamada, Akira; Shirakata, Sho; Wada, Takahiro; Niki, Shigeru; Imaizumi, Mitsuru; Hara, Kazuhiko; Uchitomi, Naotaka
• Is Part Of: Physica status solidi. Volume 12:Issue 6(2015:Jun.)
• Page Start: 749
• Page End: 752
• Publication Date: 2015-04-07
• Subjects: Solid state physics -- Congresses; Solid state physics -- Periodicals; Solid state physics; Conference proceedings; Periodicals; 530.41
• DOI: 10.1002/pssc.201400276
• Languages: English
• ISSNs: 1862-6351

Abstract

<abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <p>Cu₂ZnSnS₄ (CZTS) is one of the promising materials for high efficiency thin film solar cells. Here we report on the chemical and structural characterization of the CZTS thin films before and after the surface treatment using deionized water. X‐ray diffraction and Raman scattering spectroscopy results showed that the deionized water treatment did not affect the bulk characterization. Copper chemical composition ratio increases and sulphur composition ratio decreases with increasing deionized water treatment temperature on the film surface. In the case of the sample treated at 353 K, the surface composition changes to Cu‐rich composition. However, the chemical composition ratio of the bulk still remained before deionized water (DIW) surface treatment. The change in the CZTS surface composition according to the DIW surface treatment temperature, we think these results may help to be studied in CZTS surface in more detail. (© 2015 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p> </abstract>