Spectroscopic ellipsometry studies of as‐prepared and annealed CdS:O thin films. Issue 6 (5th May 2015)

• Record Type: Journal Article
• Authors: Khalilova, Khuraman; Shim, YongGu; Hasanov, Ilham; Asaba, Ryo; Wakita, Kazuki; Mamedov, Nazim; Tsuboi, Nozomu; Wakita, Kazuki; Yamada, Akira; Shirakata, Sho; Wada, Takahiro; Niki, Shigeru; Imaizumi, Mitsuru; Hara, Kazuhiko; Uchitomi, Naotaka
• Is Part Of: Physica status solidi. Volume 12:Issue 6(2015:Jun.)
• Page Start: 592
• Page End: 595
• Publication Date: 2015-05-05
• Subjects: Solid state physics -- Congresses; Solid state physics -- Periodicals; Solid state physics; Conference proceedings; Periodicals; 530.41
• DOI: 10.1002/pssc.201400272
• Languages: English
• ISSNs: 1862-6351

Abstract

<abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <p>Cadmium sulfide thin films on soda lime substrates were obtained by rf‐magnetron sputtering in argon‐oxygen atmosphere. As‐prepared and vacuum annealed films were then studied by spectroscopic ellipsometry at room temperature over photon energy range from 0.5 to 6 eV. The obtained ellipsometric data were treated using optical dispersion models based on Gaussian type oscillators. Dielectric function of oxygen‐free films, as well as those obtained under 3% of O/Ar partial pressure was reliably restored. At the same time, dielectric function obtained for 5% CdS:O can be regarded only as an average over several materials since our XPS examination disclosed presence of several compounds in thin films deposited at O/Ar ratios higher than 3%. (© 2015 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p> </abstract>