Domain Wall Motion Across Various Grain Boundaries in Ferroelectric Thin Films. Issue 6 (21st March 2015)

• Record Type: Journal Article
• Authors: Marincel, Daniel M.; Zhang, Huairuo; Jesse, Stephen; Belianinov, Alex; Okatan, Mahmut B.; Kalinin, Sergei V.; Rainforth, W. Mark; Reaney, Ian M.; Randall, Clive A.; Trolier‐McKinstry, Susan; Damjanovic, D.
• Is Part Of: Journal of the American Ceramic Society. Volume 98:Issue 6(2015)
• Page Start: 1848
• Page End: 1857
• Publication Date: 2015-03-21
• Subjects: Ceramics -- Periodicals; 620.1405
• DOI: 10.1111/jace.13535
• Languages: English
• ISSNs: 0002-7820

Abstract

<abstract abstract-type="main" id="jace13535-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr, Ti)O₃ films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.</p> </abstract>