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HARVARD Citation
Palazon, F. et al. (2015). X‐ray‐induced degradation of OEG‐terminated SAMs on silica surfaces during XPS characterization. Surface and interface analysis. pp. 719-722. [Online].
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Palazon, F. et al. (2015). X‐ray‐induced degradation of OEG‐terminated SAMs on silica surfaces during XPS characterization. Surface and interface analysis. pp. 719-722. [Online].