AuN films – structure and chemical binding. (17th April 2015)

• Record Type: Journal Article
• Authors: Quintero, J. H.; Arango, P. J.; Ospina, R.; Mello, A.; Mariño, A.
• Is Part Of: Surface and interface analysis. Volume 47:Number 6(2015)
• Page Start: 701
• Page End: 705
• Publication Date: 2015-04-17
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5766
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title>Abstract</title> <p>AuN films were produced on 304 stainless steel using an arc‐pulsed – assisted plasma physical vapor deposition system. The deposition was performed using an Au target in a nitrogen atmosphere at different pressures. The films were characterized using x‐ray photoelectron spectroscopy and x‐ray diffraction. A 398.1‐eV binding energy was observed and assigned to gold nitride species. The x‐ray diffraction patterns displayed a crystallographic structure that corresponded to the Au‐fcc phase with broad diffraction lines. The observed widening of the Bragg diffraction lines (rocking curves) can be attributed to the presence of interstitial nitrogen atoms in the Au‐fcc structure. Copyright © 2015 John Wiley &amp; Sons, Ltd.</p> </abstract>