Cite
HARVARD Citation
Rana, M. et al. (n.d.). Effect of Improved Tracking for Atomic Force Microscope on Piezo Nonlinear Behavior. Asian journal of control. 17 (3), pp. 747-761. [Online].
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Rana, M. et al. (n.d.). Effect of Improved Tracking for Atomic Force Microscope on Piezo Nonlinear Behavior. Asian journal of control. 17 (3), pp. 747-761. [Online].